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New microscopy research from Eindhoven University of Technology described
2009 JUN 9 - (NewsRx.com) -- Scientists discuss in 'High-angle annular dark field scanning transmission electron microscopy on carbon-based functional polymer systems' new findings in microscopy. According to recent research from Netherlands, "Two purely carbon-based functional polymer systems were investigated by bright-field conventional transmission electron microscopy (CTEM) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). For a carbon black (CB) filled polymer system, HAADF-STEM provides high contrast between the CB agglomerates and the polymer matrix so that details of the interface organization easily can be revealed and assignment of the CB phase is straightforward." "For a second system, the functional polymer blend representing the photoactive layer of a polymer solar cell, details of its nanoscale organization could be observed that were not accessible with CTEM. By varying the camera length in HAADF-STEM imaging, the contrast can be enhanced between crystalline and amorphous compounds due to diffraction contrast so that nanoscale interconnections between domains are identified," wrote E. Sourty and colleagues, Eindhoven University of Technology. The researchers concluded: "In general, due to its incoherent imaging characteristics HAADF-STEM allows for reliable interpretation of the data obtained." Sourty and colleagues published their study in Microscopy and Microanalysis (High-angle annular dark field scanning transmission electron microscopy on carbon-based functional polymer systems. Microscopy and Microanalysis, 2009;15(3):251-8). For additional information, contact E. Sourty, Eindhoven University of Technology, Laboratory of Materials and Interface Chemistry and Soft-Matter CryoTEM Research Unit, PO Box 513, NL-5600 MB Eindhoven, Netherlands. Publisher contact information for the journal Microscopy and Microanalysis is: Cambridge University Press, 32 Avenue of the Americas, New York, NY 10013-2473. Keywords: Netherlands, Electron Microscopy. This article was prepared by Medical Imaging Law Weekly editors from staff and other reports. Copyright 2009, Medical Imaging Law Weekly via NewsRx.com.
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