Microscopy

Recent studies from University of Sheffield add new data to microscopy

Published in Medical Imaging Business Week, July 24th, 2008

"Three-dimensional focused ion beam (FIB) tomography is increasingly being used for 3D characterization of microstructures in the 50 nm-20 mu m range. FIB tomography is a destructive, invasive process, and microstructural changes may potentially occur during the analysis process," scientists writing in the Journal of Microscopy - Oxford report.

"Here residual stress and crack morphologies in single-crystal sapphire samples have been concurrently analyzed using Cr3+ fluorescence spectroscopy and FIB tomography. Specifically, maps of surface residual stress have been obtained from optically polished single-crystal alumina [surface orientation (1 (1) over bar 0 2)],...

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Source: Medical Imaging Business Week (2008-07-24)

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