Patents

Ophthonix receives 14th patent for ophthalmologic diagnostic tool

Published in Medical Patent Law Weekly, February 7th, 2007

Ophthonix, Inc. has received its 14th patent. This patent includes the diagnostic capabilities of the Z-View Aberrometer to profile the high order aberrations of a patient's eye with a proprietary algorithm.

The high order profile is used to manufacture the iZon High Resolution Lens, giving the patient high definition vision. The patent also covers the use of the high order profile to generate a simulation of the high definition vision quality provided by the iZon Lens, for use by the practitioner in explaining the iZon Lens benefits to the patient.

The company's Z-View Wavefront Aberrometer, which is designed specifically for the dispensing eye care...

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Source: Medical Patent Law Weekly (2007-02-07)

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