Published in Telemedicine Business Week, October 7th, 2009
"In the present study, we achieved an energy resolution of about 0.13 eV at 0.1 s, with a spatial resolution of a few nanometers, using a monochromated STEM-EELS technique. We also assessed various methods of bandgap measurement for a-SiNx and SiO2 thin dielectric films. It was found...
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