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2009 NOV 27 ... characterized by X-ray diffraction, X-ray photoelectron spectroscopy, UV-vis, scanning electron microscopy, and solid-state nuclear magnetic resonance.""The photoelectrochemical ...
2009 NOV 27 ... oneidensis MR-1 reduced As(V) at a much lower rate and formed yellow As-S after 30 days. Electron microscopy, energy-dispersive X-ray spectroscopy, and extended X-ray absorption fine-structure ...
2009 NOV 27 ... cathode were analysed using thermal gravimetric analysis, X-ray diffraction, scanning electron microscopy/energy dispersive spectroscopy and electrochemical impedance spectroscopy. The results ...
2009 NOV 27 ... increased continuity and uniformity relative to batch immersion as measured by scanning electron microscopy (SEM) and atomic force microscopy (AFM). Transmission UV-vis (T-UV) spectra exhibit ...
2009 NOV 27 ... analysis of epiphytic diatom community was carried out under scanning electron microscopy. The epiphytic diatom abundances varied from 7 +/- A 5 to 7524 +/- A 3491 cells mm(-2). ...
2009 NOV 27 ... and its relationship to nucleation and growth processes were investigated using scanning electron microscopy (SEM), laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS), and ...
2009 NOV 27 ... 100 mc M CuSO4 (10 min) was followed by electro-olfactogram (EOG) recording and scanning electron microscopy," scientists in Faro, Portugal report."Sensitivity to amino acids ...
2009 NOV 27 ... and endothermic in nature. Fourier transform infrared spectroscopy and scanning electron microscopy were used for the characterization of possible dye-biosorbent interaction and surface ...
2009 NOV 27 ... Of UO2.0, regardless of phylogenetic or metabolic diversity. Coupled analyses, including electron microscopy, X-ray absorption spectroscopy, and powder diffraction, confirm that structurally and ...
2009 NOV 26 ... The physical and chemical properties of all substrates were characterized. Scanning electron microscopy (SEM) of coal fly ash and CSA were conducted in order to study the structural ...
2009 NOV 27 ... in aerated aquaria and then processed for anatomic studies by light and transmission electron microscopy. Some polyps from one of these reared fragments displayed spheres of various sizes ...
2009 NOV 27 ... of solid-phase U(VI) using laser-induced fluorescence spectroscopy, scanning electron microscopy, and chemical extraction of the sediment collectively indicated that the inhibition of ...
2009 NOV 27 ... as-obtained materials were characterized (by means of X-ray diffraction, transmission electron microscopy, N-2 adsorption-desorption, temperature-programmed reduction, and X-ray photoelectron ...
2009 NOV 27 ... at limiting native oxide formation for more than 55 days in ambient conditions. A two-electron per silicon mechanism is proposed for electrografting a single (1:1) alkyl group per ... morphology and chemistry are investigated using atomic force microscopy, Fourier transform infrared spectroscopy, and X-ray photoelectron spectroscopy (XPS). ...
2009 NOV 27 ... are associated with decomposition of materials such as processing aids. Transmission electron microscopy (TEM) reveals a modest increase in average Pt nanoparticle size upon thermal ...
2009 NOV 25 ... structure was evaluated using quantitative and qualitative X-ray analysis. Scanning electron microscopy revealed primary proliferation of the cells cultivated 14 days and showed elevations in ...
2009 NOV 27 ... the DNA of eukaryotic and prokaryotic cells for both luminescence and transition electron microscopy. This MLCT 'light switch' complex directly images nuclear DNA of living cells without ...
2009 NOV 25 ... Xu and colleagues, Polytechnic University.The researchers concluded: "The electron and hole mobility-lifetime products were evaluated using alpha particle ... which showed that the hand gap variation in the CdZnTe wafers is less than 0.004 eV. IR microscopy showed that the diameters of the Te inclusions present in the material are in the range ...
2009 NOV 27 ... is caused by subtleties in the film processing conditions that ultimately lead to poor electron extraction from the devices. For low-performing devices, photogeneration and charge ... difference in the effective mobilities of the electrons and holes. Atomic force microscopy (AFM) experiments reveal that the top surface of these low-performing devices is nearly ...
2009 NOV 27 ... environment of Nd in these matrices was gained from the combined use of scanning electron microscopy (SEM), synchrotron-based, mu-X-ray fluorescence (mu-XRF), mu-X-ray (mu-XAS), and bulk ...
